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Technical Committee No TC04
Status Active
Category Metrology Sector
Sub Category

This International Document is addressed primarily to two groups — OIML Secretariats and legal metrology officials — concerned with pattern evaluation and pattern approval of measuring instruments. OIML Secretariats are responsible for the drafting of International Recommendations for measuring instruments subject to pattern evaluation and approval. Legal metrology officials are responsible for the adoption and implementation of pattern evaluation and pattern approval requirements.

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