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Technical Committee No |
TC03 |
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Status |
Active |
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Category |
Electrical Sector |
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Sub Category |
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$Resources:StandardType; |
Kuwaiti Standard |
This part of IEC 62396 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes.
Although developed for the avionics industry, this process may be applied by other industrial sectors.
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Decision No |
10/2022 |
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Decision By |
From Ministers Office |
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Date of Meeting |
14-07-2021 |
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Approval Date |
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Decision Date |
02-06-2022 |
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Newspaper Publication Date |
14-06-2022 |
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Newspaper Number |
1588 |
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